| 1. |
Measurement of Paraxial Properties of Optical Systems |
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1.1 |
Thin Lenses |
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1.1.1 |
Measurements Based on Image Equation |
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1.1.2 |
Autocollimation Technique |
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1.1.3 |
Geneva Gauge |
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1.1.4 |
Neutralization Test |
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1.1.5 |
Focometer |
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1.2 |
Thick Lenses |
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1.2.1 |
Focal Collimator |
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1.2.2 |
Reciprocal Magnification |
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1.2.3 |
Nodal-Slide Lens Bench |
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| 2. |
Qualification of Optical Material |
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2.1 |
Internal Defects |
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2.2 |
Measurement of Refractive Index |
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2.2.1 |
Spectrometer |
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2.2.1.1 |
Basic Spectrometer Technique |
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2.2.1.2 |
Autocollimating Goniometer |
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2.2.1.3 |
Hilger Chance Refractometer |
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2.2.2 |
Critical Angle Systems |
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2.2.2.1 |
Abbe Refractometer |
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2.2.2.2 |
Pulfrich Refractometer |
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2.2.3 |
Ellipsometry |
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2.3 |
Strain |
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2.4 |
Mechanical and Thermal Properties |
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| 3. |
Aberrations |
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3.1 |
Sign Conventions |
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3.2 |
Aberration Free Image |
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3.3 |
Spherical Wavefront, Defocus, and Lateral Shift |
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3.4 |
Angular, Transverse, and Longitudinal Aberration |
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3.5 |
Seidel Aberrations |
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3.5.1 |
Spherical Aberration |
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3.5.2 |
Coma |
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3.5.3 |
Astigmatism |
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3.5.4 |
Field Curvature |
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3.5.5 |
Distortion |
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3.6 |
Zernike Polynomials |
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3.7 |
Relationship between Zernike Polynomials and Third-Order
Aberrations |
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3.8 |
Peak-Valley and RMS Wavefront Aberration |
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3.9 |
Strehl Ratio |
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3.10 |
Chromatic Aberrations |
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3.11 |
Aberrations Introduced by Plane Parallel Plate |
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3.12 |
Aberrations of Simple Thin Lenses |
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3.13 |
Conics |
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3.13.1 |
Basic Properties |
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3.13.2 |
Spherical Aberration |
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3.13.3 |
Coma |
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3.13.1 |
Astigmatism |
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3.14 |
General Aspheres |
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| 4. |
Basic Interferometry and Optical Testing |
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4.1 |
Two Beam Interference |
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4.2 |
Fizeau Interferometer |
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4.3 |
Twyman-Green Interferometer |
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4.4 |
Laser Based Fizeau |
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4.5 |
Mach-Zehnder Interferometer |
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4.6 |
Typical Interferograms |
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4.7 |
Interferograms and Moiré Patterns |
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4.8 |
Classical Techniques for Inputting Data into Computer |
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| 5. |
Direct Phase Measurement Interferometry |
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5.1 |
Introduction |
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5.2 |
Zero-Crossing Technique |
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5.3 |
Phase-Lock Interferometry |
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5.4 |
Up-Down Counters |
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5.5 |
Phase-Stepping and Phase-Shifting Interferometry |
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5.5.1 |
Introduction |
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5.5.2 |
Phase Shifters |
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5.5.3 |
Moving Mirror |
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5.5.4 |
Diffraction Grating |
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5.5.4.1 |
Bragg Cell |
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5.5.4.2 |
Polarization Phase Shifters |
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5.5.4.2.1 Rotating Half-Wave Plate |
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5.5.4.2.2 Rotating Polarizer |
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5.5.4.3 |
Zeeman Laser |
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5.5.4.4 |
Frequency Shifting Source |
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5.5.5 |
Algorithms |
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5.5.6 |
Phase-Unwrapping |
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5.5.7 |
Phase Shifter Calibration |
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5.5.8 |
Errors |
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5.5.9 |
Solving the Vibration Problem |
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5.5.9.1 |
Measure Vibration and Introduce Vibration 180 Degrees Out of Phase to Cancel Vibration |
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5.5.9.2 |
Spactial Synchronous and Fourier Methods |
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5.5.9.3 |
Spatial Carrier Technique |
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5.5.9.4 |
Simultaneous Phase-Measurement Interferometer |
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5.5.9.5 |
Single-Shot Holographic Polarization Dynamic Interferometer |
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5.5.9.6 |
Pixilated Polarizer Array Dynamic Interferometer |
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5.6 |
Phase-Shifting Non-Destructive Testing |
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5.7 |
Multiple Wavelength and White Light Phase-Shifting Interferometry |
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5.8 |
Vertical Scanning (Coherence Probe) Techniques |
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| 6. |
Measurement of Surface Quality |
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6.1 |
View Transmitted or Reflected Light |
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6.2 |
Mechanical Probe |
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6.3 |
AFM |
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6.4 |
Lyot Test |
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6.5 |
FECO |
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6.6 |
Nomarski Interferometer |
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6.7 |
Sommargren Profiler |
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6.8 |
Interference Microscope |
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| 7. |
Testing Flat Surface Optical Components |
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7.1 |
Mirrors |
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7.1.1 |
Fizeau Interferometer |
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7.1.2 |
Twyman-Green Interferometer |
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7.1.3 |
Ritchey-Common Test |
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7.1.4 |
Naked Eye Test |
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7.2 |
Windows |
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7.2.1 |
Interferometer |
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7.2.2 |
Autocollimator |
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7.3 |
Prisms |
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7.3.1 |
Interferometer |
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7.3.2 |
Goniometer |
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7.3.3 |
Autocollimator |
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7.3.4 |
Naked Eye Test |
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7.4 |
Corner Cubes |
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7.5 |
Diffraction Grating |
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7.6 |
Index Inhomogeneity |
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| 8. |
Testing of Curved Surfaces and/or Lenses |
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8.1 |
Radius of Curvature |
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8.1.1 |
Spherometer |
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8.1.2 |
Autostigmatic Measurement |
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8.1.3 |
Newton's Rings |
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8.1.4 |
Interferometer and Radius Slide |
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8.2 |
Surface Figure |
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8.2.1 |
Test Plate |
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8.2.2 |
Twyman-Green Interferometer (LUPI) |
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8.2.3 |
Fizeau (Laser Source) |
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8.2.4 |
Spherical Wave Multiple Beam Interferometer (SWIM) |
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8.2.5 |
Shack Cube Interferometer |
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8.2.6 |
Scatterplate Interferometer |
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8.2.7 |
Smartt Point Diffraction Interferometer |
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8.2.8 |
Sommargren Diffraction Interferometer |
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8.2.9 |
Measurement of Cylindrical Surfaces |
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8.2.10 |
Star Test |
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8.2.11 |
Shack-Hartmann Test |
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8.2.12 |
Scots Test |
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8.2.13 |
Foucault Test |
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8.2.14 |
Wire Test |
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8.2.15 |
Ronchi Test |
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8.2.16 |
Lateral Shear Test |
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8.2.17 |
Radial Shear Test |
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| 9. |
Special Interferometric Tests for Aspherical Surfaces |
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9.1 |
Description of Aspheric Surfaces |
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9.2 |
Null Test |
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9.2.1 |
Conventional Null Optics |
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9.2.2 |
Holographic Null Optics |
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9.2.3 |
Computer Generated Holograms |
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9.3 |
Non-Null Test |
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9.3.1 |
Lateral Shear Interferometry |
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9.3.2 |
Radial Shear Interferometry |
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9.3.3 |
High-Density Detector Arrays |
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9.3.4 |
Sub-Nyquist Interferometry |
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9.3.5 |
Long-Wavelength Interferometry |
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9.3.6 |
Two-Wavelength Holography |
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9.3.7 |
Two-Wavelength Interferometry |
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9.3.8 |
Moiré Interferometry |
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| 10. |
Absolute Measurements |
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10.1 |
Flat Surfaces |
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10.2 |
Spherical Surfaces |
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10.3 |
Surface Roughness |
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| 11. |
System Evaluation |
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11.1 |
Resolution Tests |
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11.2 |
Veiling Glare |
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11.3 |
Spread Function Measurement |
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11.4 |
Encircled Energy Measurement |
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11.5 |
Optical Transfer Function Measurement |
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11.5.1 |
Scanning Methods |
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11.5.2 |
Interferogram Analysis |
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11.5.3 |
Autocorrelation Method |