Research Scientist | Nanometrics

Date Posted: 
Wednesday, July 31, 2013
Position Location: 
Milpitas, Calif.
Job Description: 

In this position, the candidate will lead, design and execute product development projects, particularly those related to spectroscopic ellipsometry for thin film and OCD metrology. The candidate will use spectroscopic metrology concepts and company objectives to resolve complex metrology issues such as precision, stability, and matching in creative and effective ways. The candidate will also work closely with algorithms, applications, and manufacturing teams to provide systems level guidelines to solve the complex metrology issues.


Interested parties can contact Kurt Werder at or 925-389-7289. Additional information as well as other postings are available at