Research Areas

Quantum Optics

• Theoretical Atom Optics

• Nonlinear Optics

• Semiconductor Nonlinear Optics

• Optical Propagation

• Laser Theory

• Solid State Theory

• Semiconductor Quantum Dots and Quantum Wells

Faculty: Brian Anderson, Rolf Binder, Alexander Cronin, Hyatt M. Gibbs, Poul Jessen, R. Jason Jones, Galina Khitrova, Carl Maes, Pierre Meystre, Jerome V. Moloney, Arvinder Sandhu, Ewan Wright

Opto-Electronics

• Nonlinear Materials

• Thin Films

• Device Fabrication

• Displays

• Lasers and Nonlinear Optics Devices

• Photorefractive Polymers

• Optical Nanofabrication and Nanostructures

• Multilayered Materials and Superlattices

Faculty: Charles M. Falco, Mahmoud Fallahi, Hong Hua, Masud Mansuripur, Sumit Mazumdar, Robert A. Norwood, Stanley Pau, Nasser Peyghambarian, Supapan Seraphin, Jayan Thomas, Richard Ziolkowski

Optical Communications

• Magneto-Optics

• Storage Media

• Optical Signal Processing

• Optical Data Storage Head Design

• Holographic Storage

• Fiber Optic Systems and Components

• Optical Sensors

• Optical Waveguides

Faculty: Amit Ashok, Milorad Cvijetic, Masud Mansuripur, Tom Milster, Robert A. Norwood, Stanley Pau, Nasser Peyghambarian, Jayan Thomas

Optical Systems Design and Fabrication

• Optical Design Analysis

• Fabrication of Very Large Optics

• Athermalized Materials for Optical Mounts

• Lithography

• Diffractive Optics

• Finite Element Analysis

• Optical Coatings

• Novel Instruments for Remote Sensing

Faculty: J. Roger P. Angel, James H. Burge, Eustace L. Dereniak, John Greivenkamp, Hong Hua, Raymond K. Kostuk, Rongguang Liang, Tom Milster, José Sasián, James Schwiegerling, Yuzuru Takashima

Optical Imaging Systems and Analysis

• Biomedical Imaging Systems

• Magnetic Resonance Imaging Systems

• Image Processing and Classification for Radiology, Pathology and Ophthalmology

• Extreme Ultraviolet Microlithography Imaging Algorithms

• Active Optics Control Software

• Hyperspectral/Polarimetric Sensing

• Remote Sensing

Faculty: J. Roger P. Angel, Harrison H. Barrett, Jennifer Barton, Russell Chipman, Eric Clarkson, Eustace L. Dereniak, Lars Furenlid, Arthur Gmitro, John Greivenkamp, Hong Hua, Matthew Kupinski, Rongguang Liang, Tom Michael Lloyd-Hart, Tom Milster, Mark Neifeld, Leilei Peng, Nasser Peyghambarian, José Sasián, James Schwiegerling, Yuzuru Takashima, J. Scott Tyo, Urs Utzinger, Russell Witte

Metrology, Test and Measurement

• Scanning Probe Microscopy

• Confocal Microscopy

• Ellipsometry

• Interferometry

• Shack-Hartmann Tester for Aspheric Optics

• Thermal Expansion

• Absolute Radiometric Calibration of Advanced Remote Sensing Systems

Faculty: Stuart Biggar, James H. Burge, Russell Chipman, Leilei Peng, James Schwiegerling, J. Scott Tyo, James C. Wyant