OPTI 576
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Thin Film Optics (3 units). This course will provide an understanding
of some of the significant physical mechanisms involved in the growth, structure and optical
properties of thin films. The basic electromagnetic theory of multilayer thin films will be
covered, with application to coatings including antireflection, reflection, beam splitters,
dichroic filters, and bandpass filters. Examples ranging from the infrared to soft x-rays will
be discussed.
Meeting Times:
Lectures T&TH 9:30 to 10:45, 16 weeks per semester
Instructor:
Charles M. Falco
Gould-Simpson Building, Room 1021
falco@u.arizona.edu | 621-6771 | FAX 621-4356
Overview:
Optical systems for wavelengths from the IR to beyond the Vacuum
Ultra-Violet (VUV) require thin film coatings of various kinds to
function properly. In the visible, for example, acceptable performance
of multilayer lenses would not be possible without thin-film
antireflection coatings. In the VUV or soft-x-ray regime, focusing
optics are now possible using multilayer thin film coatings. Thin films
also are essential for many other optical applications, such as Schottky-barrier
IR detectors, media for magneto-optical data storage, and diode lasers.
This course will provide an understanding of some of the significant
physical mechanisms involved in the growth, structure and optical
properties of thin films for use in the wavelength range ~1 nm–1 µm.
The basic electromagnetic theory of multilayer thin films will be
covered, with application to coatings including reflection,
antireflection, beam splitters, dichroic filters, and bandpass filters.
Examples ranging from the IR to the soft-x-ray will be discussed.
Course Outline:
Growth of Thin Films
Physical Mechanisms Involved in the Most Common Techniques:
Sputtering
Evaporation (with emphasis on Molecular Beam Epitaxy)
Nucleation and Growth Phenomena
Structure of Thin Films
Physical Structure:
Diffraction Theory
Application of diffraction theory to x‑rays, high and low energy electrons, etc.
Chemical (Compositional) Structure:
Physical principles of specific probes, including RBS, XPS, Auger, etc.
Optical Thin Films
Theory:
Maxwell's equations; reflectance, transmittance and absorptance; Smith Chart, etc.
Optical Coatings:
Reflection, antireflection, beam splitters, dichroic filters, bandpass filters, etc.
Optical Data Storage: magneto-optical media, phase-change media, etc.
Active Optical Thin Films: diode lasers
Each of the above three major sections will make up approximately one-third of the lectures.
Textbook:
Baumeister, Philip W. (2004). Optical Coating Technology. Bellingham, Washington: SPIE Press.
ISBN 0-8194-5313-7
Supplemental material will be drawn from a variety of sources, including
monographs and review papers in the Science Library.
Grading:
Three homework assignments and a take-home final exam each will be given
equal weight. An overall score >85% = A, >75% = B, >60% = C, and < 60% = D.
Other Policies:
- "Incompletes" will only be given under very special circumstances,
especially if no prior agreement with me has been made. Note: by
"prior" I mean you should see me as soon as some situation arises which
you feel might keep you from completing the course.
- Office hours: Since experience shows that rigid office hours do not
fit everyone's schedule, I have an "open door" policy where you can drop
by any time you want to discuss something. However, since my office is
located in a building that's a 10–15 minute walk from OSC, if you want
to make sure I'll be there at a specific time, either call (621-6771) or
e-mail (falco@u.arizona.edu) to schedule a mutually convenient time. My
office is on the 10th floor of Gould-Simpson, room 1021.
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