Dror Sarid
Professor, Optical Sciences and Director, Optical Data Storage Center
Optical Sciences Center, University of Arizona, Tucson Arizona 85721 USA
Publications and Patents
1. Books and Book Chapters
D. Sarid, Scanning Force Microscopy, With Applications to Electric, Magnetic, and Atomic Forces, Oxford University Press (1991).
Dror Sarid, Scanning Force Microscopy, With Applications to Electric, Magnetic, and Atomic Forces, Oxford University Press, Revised Edition, (1994).
D. Sarid, High-speed Scanning Tunneling Microscopy, McGraw-Hill Yearbook of Science and Technology, McGraw-Hill, pp. 202, (1995)
D. Sarid, “Laser Diode Detection,” section in Procedures in Scanning Probe Microscopy, John Wiley and Sons (1996).
D. Sarid, Exploring Scanning Probe Microscopy with Mathematica, Wiley Interscience (1997).
C.A. Peterson and Dror Sarid, Atomic Force Microscopy, Kirk-Othmer Encyclopedia of Chemical Technology, John Wiley and Sons (2002).
D. Sarid, B. Mc Carthy and G.E. Jabbour, Nanotechnology for Data Storage Applications, Springer-Verlag Handbook on Nanotechnology (2003).
D. Sarid, Exploring Scanning Probe Microscopy with Mathematica, Wiley
Interscience (Revised and Expanded Edition in preparation, 2006).
D. Sarid and W. Low, “Optical spectra of V3+-V3+ and V3+-Cr3+ pairs in Al2O3,” Bull. Am. Phys Soc. 12, 655 (1967).
J. Shaham-Bronstein, D. Sarid, and W. Low, “Brillouin scattering at 1 GHz in quartz,” Conference of the Israel Physical Society (1969).
J. Shaham-Bronstein, D. Sarid, and W. Low, “Phase velocity and attenuation of hypersound in water of different isotopic constitution,” J. Chem. Phys 52, 3201 (1970).
W. Low, D. Sarid, and S. Sussman, “Attenuation measurements in benzene using Brillouin scattering techniques,” J. Chem. Phys. 57, 2595 (1972).
D. Sarid and D. S. Cannell, “A 15 microdegree temperature controller,” Rev. Sci. Instrum. 45, 1082 (1974).
D. S. Cannell and D. Sarid, “Sound propagation in SF6 near the critical point,” Phys. Rev. A 10, 2280 (1974).
Z.H. Cho, M.K. Watt, M. Slapa, P.A. Tove, M. Schieber, T. Dvies, W. Schnepple, P. Randtke, R. Carlson, and D. Sarid, “Characterization effort of HgI2 radiation detectors by pulsed laser transient charge injection technique,” IEEE Trans. Nucl. Sci NS-22, 229 (1975).
D. Sarid and D.S. Cannell, “Analysis of sound propagation in xenon near the critical point,” Phys. Rev. A 15, 735 (1977).
D. Sarid and G.I. Stegeman, “Light scattering on internal reflection from surface acoustic waves,” J. Opt. Soc. Am. 67, 1444 (1977).
D. Sarid and G.I. Stegeman, “Light scattering on internal reflection from surface acoustic waves,” J. Appl. Phys. 49, 2301 (1978).
D. Sarid and G.I. Stegeman, “Direct measurement of the partial waves of a surface acoustic wave by means of light scattering,” Appl. Phys. Lett. 32, 511 (1978).
D. Sarid, “The line shape of the light scattered by surface acoustic waves upon total internal reflection,” J. Appl. Phys. 49, 5373 (1978).
D. Sarid, P.J. Cressman, and R.L. Holman, “High-efficiency prism coupler for optical waveguides,” Appl. Phys. Lett. 33, 513 (1978).
D. Sarid and D. Kermisch, “Prism-waveguide coupling efficiency for wave guides with an arbitrary refractive-index profile,” Appl. Phys. Lett. 33, 619 (1978).
D. Sarid, “High efficiency input-output prism waveguide coupler: an analysis,” Appl. Opt. 18, 2921 (1979). (See cover of volume).
D. Sarid and D. Kermisch, “A practical integrated optics device,” Proc. SPIE 176 (1979).
D. Sarid, “Recovery of the refractive-index profile of an optical waveguide from the measured coupling angles,” Appl. Opt. 19, 1606 (1980).
J.F. Revelli and D. Sarid, “Prism coupling into clad uniform optical waveguides,” J. Appl. Phys. 51, 3566 (1980).
D. Sarid, “Second-harmonic generation in the presence of prism coupling into an optical waveguide,” Appl. Phys. Lett. 117 (1980).
D. Sarid, D. Kermisch, and J. Revelli, “On the theory of the prism waveguide coupler in the stron coupling regime,” J. Appl. Phys. 51, 6105 (1980).
G.I. Stegeman, D. Sarid, J.J. Burke, and D.G. Hall, “Scattering of guided waves by surface periodic gratings for arbitrary angles of incidence: perturbation field theory and implications to normal-mode analysis,” J. Opt. Soc. Am. 71, 1497 (1981).
4.2 Semiconductor Nonlinearities
D. Sarid and G. I. Stegeman, “Optimization of the effects of power dependent refractive indices in optical waveguides,” J. Appl. Phys. 52, 5439 (1981).
D. Sarid, “Analysis of bistability in a ring-channel waveguide,” Opt. Lett. 6, 552 (1981).
D. Sarid, “Intrinsic bistable guided-wave devices: theory and applications,” Proc. SPIE 317, 132 (1981).
D. Sarid and M. Sargent III, “Tunable nonlinear directional coupler,” J. Opt. Soc. Am. 72, 835 (1982).
D. Sarid, “Guide-wave controlled etalons,” Phil. Trans. R. Soc. Lond. A 313, 371 (1984).
D. Sarid, R. S. Jameson, and R. K. Hickernell, “Optical bistability on reflection with an InSb etalon controlled by a guided wave,” Opt. Lett. 9, 159 (1984).
H. M. Gibbs, U. Gibson, N. Peyghambarian, D. Sarid, and G. Stegeman, “Optical circuitry cooperative,” Proc. SPIE (1984).
D. Sarid, “Guided-wave controlled etalons,” Optical Bistability Dynamical Nonlinearity and Photonic Logic, The Royal Society, p.181 (1984).
D. Sarid, D. W. M. Gibbons, H. M. Gibbs, S. W. Koch, and L. Banyai, “Optical waveguides in bulk and multiple quantum well structures,” Optical Bistability III, Proc. Topical Meeting Tucson, AZ, p.91 (1985).
R. S. Jameson and D. Sarid, “Logic operations using a bistable etalon with two control beams,” IEEE J. Quantum Electron. QE-21, 1348 (1985).
S. Ovadia, H. M. Gibbs, J. L. Jewell, D. Sarid, and N. Peyghambarian, “Evidence that room-temperature optical bistability is excitonic in both bulk and multiple-quantum-well GaAs,” Optical Engineering 24, 565 (1985).
D. Sarid, N. Peyghambarian, and B. M. McGinnis, “Optical bistability in the presence of spatial dispersion,” IEEE J. Quantum Electron. QE-21, 1379 (1985).
D. Sarid and R. S. Jameson, “InSb as a material for optical computer components,” Proc. SPIE (1986).
D. Sarid, B. K. Rhee, B. P. McGinnis, and C. J. Sandroff, “Degenerate four-wave mixing from layered semiconductor clusters in the quantum size regime,” Appl. Phys. Lett. 49, 1196 (1986).
M. Warren, W. M. Gibbons, K. Komatsu, D. Sarid, D. Hendricks, and H. M. Gibbs, “Electronic optical bistability in GaAs/AlGaAs strip loaded waveguide,” Appl Phys. Lett. 51, 1209 (1987).
W. M. Gibbons and D. Sarid, “Effect of carrier diffusion on the nonlinear response of optical waveguides,” Opt. Lett. 12, 564 (1987).
W. M. Gibbons and D. Sarid, “Model of a nonlinear directional coupler in GaAs,” Appl. Phys. Lett. 12, 564 (1987).
H. M. Gibbs, U. J. Gibson, N. Peyghambarian, D. Sarid, C. T. Seaton, G. I. Stegeman, and M. Warren, “Optical Circuitry,” in Encyclopedia of Physical Science 9, 580 (1987).
W. M. Gibbons and D. Sarid, “Model of a nonlinear Mach-Zehnder interferometer in gallium arsenide,” J. de Phys. 49, C2-297 (1988).
H. M. Gibbs, M. Warren, W. Gibbons, K. Komatsu, D. Sarid, D. Hendericks, and M. Sugimoto, “Electronic optical bistability in GaAs-AlGaAs strip-loaded waveguides,” J. de Phys. 49, C2-305 (1988).
5. Long-Range Surface-Plasmons
D. Sarid, “Long-range surface-plasma waves on very thin metal films,” Phys. Rev. Lett. 47, 1927 (1981).
D. Sarid, R. Deck, A. Craig, R. Hickernell, and R. Jameson, “Optical field enhancement by long-range surface-plasma waves,” Appl. Opt. 21, 3993 (1982).
D. Sarid, “The nonlinear propagation constant of a surface plasmon,” Appl. Phys. Lett. 39, 889 (1981).
D. Sarid, R. T. Deck, and J. J. Fasano, “Enhanced nonlinearity of the propagation constant of a long-range surface-plasma wave,” J. Opt. Soc. Am. 72, 1345 (1982).
R. T. Deck and D. Sarid, “Enhancement of second harmonic generation by coupling to long-range surface plasmons,” J. Opt. Soc. Am. 72, 1613 (1982).
A. E. Craig, G. A. Olson, and D. Sarid, “Experimental observation of the long-range surface-plasmon polariton,” Opt. Lett. 8, 380 (1983).
D. Sarid, “Long-range surface-plasmon polaritons,” Optics 83: A Report on Emerging Technologies, Optical Society of America (1983).
R. T. Deck, D. Sarid, G. A. Olson, and J. M. Elson, “Coupling between finite electromagnetic beam and long-range surface-plasmon mode,” Appl. Opt. 22, 3397 (1983).
A. E. Craig, G. A. Olson, and D. Sarid, “Novel system for coupling to surface-plasmon polaritons,” Appl. Opt. 24, 61 (1985).
R. A. Booman, G. A. Olson, and D. Sarid, “Determination of loss coefficients of long-range surface plasmons,” Appl. Opt. 25, 2729 (1986).
R. K. Hickernell and D. Sarid, “Optical bistability using prism-coupled long-range surface plasmons,” J. Opt. Soc. Am. 3, 1059 (1986).
5.2 Magnetoplasmons and Magnetics
D. Sarid, “Enhanced surface-magnetoplasma interactions in a semiconductor,” Phys. Rev. B Rapid Commun. 29, 2344 (1984).
D. Sarid, “Enhanced magnetic interaction of surface-magnetoplasmon polariton,” J. Quantum Electron. QE-20, 943 (1985).
R. K. Hickernell and D. Sarid, “Long-range surface magnetoplasmons in thin nickel films,” Opt. Lett. 12, 564 (1987).
D. Sarid, M. N. Deeter, and V. Kahwaty, “Optical probing of magnetically inert layers,” Appl. Opt. 26, 3153 (1987).
M. N. Deeter and D. Sarid, “Effects of incident angle on read-out in magneto-optic storage media,” Appl. Opt. 27, 713 (1988).
M. N. Deeter, J. T. Ingle, and D. Sarid, “Jones-matrix analysis of incident-angle effects in storage media,” Appl. Opt. 28, 335 (1988).
M. N. Deeter, D. Sarid, C. D. England, W. R. Bennett, and C. M. Falco, “Determination of effective optical constants of magnetic multilayers,” Appl. Phys. Lett. 54, 2059 (1989).
D. Sarid, N. Peyghambarian, and H. M. Gibbs, “Analysis of biexcitonic optical bistability in CuCl in the presence of collision broadening,” Phys. Rev. B 29, 1184 (1983).
N. Peyghambarian, D. Sarid, and H. M. Gibbs, “Collision broadening model for the biexciton resonance in CuCl,” Opt. Commun. 49, 125 (1984).
D. Sarid, N. Peyghambarian, and H. M. Gibbs, “Local field effect in the biexciton system in CuCl,” Phys. Rev. B 31, 4031 (1985).
7. Scanning Tunneling Microscopy
D. Sarid, B. P. McGinnis, and T. D. Henson, “Four-wave mixing and scanning tunneling microscopy of semiconductor clusters,” SPIE 881, 114 (1988).
D. Sarid, T. D. Henson, L. S. Bell, and C. J. Sandroff, “Scanning tunneling microscopy of semiconductor clusters,” J. Vac. Sci. Technol. A 6, 424 (1988).
D. Sarid, T. D. Henson, N. Armstrong, and L. S. Bell, “Probing of basal planes of MoS2 by scanning tunneling microscopy,” Appl. Phys. Lett. 52, 2252 (1988).
T. D. Henson, D. Sarid, and L. Stephen Bell, “Scanning tunneling microscopy of layered-structure semiconductors,” J. Microscopy 152, 467 (1988).
D. Sarid, “Holographic display of scanning tunneling microscopy images,” Opt. News, August 11 (1988).
T. Iwabuchi, C. Chuang, G. Khitrova, M. E. Warren, A. Chavez-Pirson, H. M. Gibbs, D. Sarid, and M. Gallagher, “Fabrication of GaAs nanometer structures by dry etching,” SPIE 1284, 142 (1990).
S. Howells, M. Gallagher, T. Chen, and D. Sarid, “Oxidation effects on cleaved multiple quantum well surfaces in air observed by scanning probe microscopy,” Appl. Phys. Lett. 61, 801 (1992).
H. Giessen, B. P. Jacobsen, D. Sarid, M. Grin, U. Becker, and C. Klingshirn, “Growth of Wurtzite CdSe thin films with extremely narrow excitonic luminescence by hot wall epitaxy and their characterization,” Proc. of the CLEO '93 Conference, Baltimore, MD, (May 2-7, 1993).
X. Yao, M. Fallahi, R. K. Workman, C. A. Peterson, and D. Sarid, “Observation of interface band bending on GaAs-AlAs heterostructures by scanning tunneling microscopy,” SPIE 3285, 51 (1998).
X. Yao, D. Sarid, Z. Yu, J. Wang, D. S. Marshall, R. Droopad, J. K. Abrokwah, J. A. Hallmark, and W. J. Ooms, “Initial stages of Ba adsorption on Si(100)-((2x1)) surface at room temperature,” Phys. Rev. B 59, 5115, (1999).
X. Hu, X. Yao, D. Sarid, Z. Yu, J. Wang, D. S. Marshall, R. Droopad, J. K. Abrokwah, J. A. Hallmark, and W. J. Ooms, “Phases of Ba Adsorption onFormation of a (2 x 3) reconstruction on Ba-adsorbed Si(100)-(2 x 1) surfaces,” Surf. Sci. 426, 69 (1999).
X. Hu, X. Yao, D. Sarid, Z. Yu, J. Wang, D. S. Marshall, R. Droopad, J. A. Hallmark, and W. J. Ooms, “The (3x2) phase of Ba adsorption on Si(100)-2x1 surfaces,” Surf. Sci. 445, 256 (1999).
X. Hu, X. Yao, D. Sarid, Z. Yu, J. Wang, D. S. Marshall, R. Droopad, J. K. Abrokwah, J. A. Hallmark, and W. J. Ooms, “Ba adsorption on Si(100)-2x1 at room temperature: A bi-polar STM study,” Surf. Sci. 457, L391 (2000).
X. Hu, X. Yao, C. A. Peterson, D. Sarid, Z. Yu, J. Wang, D. S. Marshall, R. Droopad, J. A. Hallmark, and W. J. Ooms, “The (3x2) phase of Ba adsorption on Si(001)-2x1 surfaces,” Proc. of the 10th International Conference on STM/STS and Related Proximal Probe Microscopy, Seoul, Korea, 19-23 July (1999).
X. Hu, J. Yu, J. L. Edwards and W. J. Ooms, “Sr absorprion on Si(100)-(2x1) studied by LEED, AES, and STM,” International Scanning Tunneling Microscopy Conference, University of British Colombia, Vancouver, Canada, 15-20 July (2000).
X. Hu, J. Yu, J. A. Curless, R. Droopad, K, Eisenbeiser, J. L. Edwards and W. J. Ooms, “Comparative study of Sr and Ba on Si(100), Appl. Surf. Sci., 181, 103 (2001).
M. J. Gallagher, S. Howells, L. Yi, T. Chen, and D. Sarid, “Photon emission from gold surfaces in air using scanning tunneling microscopy,” Surf. Sci. 278, 270 (1992).
M. J. Gallagher, T. G. Ruskell, D. Chen, D. Sarid, and H. Jenkinson, “Nanosecond time-scale semiconductor photoexcitations probed by a scanning tunneling microscope,” Appl. Phys. Lett. 64, 256 (1994).
T. G. Ruskell, M. J. Gallagher, D. Chen, and D. Sarid, “Nanosecond time-scale semiconductor photoexcitations probed by a scanning tunneling microscopy,” Optics and Photonics News, December (1994).
T. G. Ruskell, D. Chen, and D. Sarid, “Scanning tunneling spectroscopy of photoexcitations on a nanosecond time-scale,” Mat. Res. Soc. Symp. Proc., MRS Volume 380-Materials, Fabrication and Patterning at the Nanoscale, pp 113, C. R. K. Marrian, K. Kash, F. Cerrina, M. Lagally, eds. (1995).
D. Sarid, “High-speed scanning tunneling microscopy,” pp. 202, McGraw-Hill Yearbook of Science and Technology, McGraw-Hill (1995).
D. Sarid, E. H. Thall, D. A. Iams, J. T. Ingle, T. D. Henson, Y. C. Lee, and L. S. Bell, “Scanning tip microscopy with applications to biology,” SPIE 1063, 42 (1989).
S. R. Hameroff, Y. Simic-Kristic, L. A. Venetti, Y. C. Lee, D. Sarid, J. Weidmann, V. Elings, K. Kjoller, and R. S. McCuskey, “STM of cytoskeletal proteins: microtubules and intermediate filaments,” J. Vac. Sci. Technol. 8, 687 (1990).
L. A. Vernetti, C. L. A. Nowline, S. R. Hameroff, A. J. Gandolfi, Y. C. Lee, and D. Sarid, “STM resolution of surface features on cytokeratin protein is enhanced by prolonged exposure of protein to cold temperatures,” J. Vac. Sci. Technol. B 9, 1223 (1991).
L. A. Vernetti, D. Sarid, A. J. Gandolfi, A. E. Cress, R. B. Nagle, R. McCuskey, and S. R. Hameroff, “STM images of cytokeratin and binding IgG antibody,” AIP Proc. Conf. on Scanned Probe Microscopies 241, 232 (1992).
L. A. Vernetti, D. Sarid, A. J. Gandolfi, R. B. Nagle, S. R. Hameroff, R. McCuskey, and A. E. Cress, “The topographic structure of cytokeratin intermediate filamnents using scanning tunneling microscopy,” Nanobiology 1, 379 (1992).
T. Chen, S. Howells, M. Gallagher, L. Yi, D. Sarid, D. L. Lichtenberger, K. W. Nebesney, and C. D. Ray, “Modelling of internal structure of monolayer C60 molecules on a gold substrate,” Mat. Res. Soc. Symp. Proc. 208, 721 (1991).
T. Chen, S. Howells, M. Gallagher, L. Yi, D. Sarid, D. Lichtenberger, and C. Ray, “Internal structure and two-dimensional order of monolayer C60 molecules observed with STM,” J. Vac. Sci. Technol. B 9, 2461 (1991). Also reprinted J. Vac. Sci. Technol. B 10, 170 (1992).
D. Sarid, T. Chen, S. Howells, M. Gallagher, L. Yi, D. Lichtenberger, and D. Huffman, “Buckyball-substrate interactions probed by STM and AFM,” Ultramicroscopy 42-44, 610 (1992). (See also journal covers.)
S. Howells, T. Chen, M. Gallagher, D. Sarid, D. L. Lichtenberger, L. L. Wright, C. D. Ray, D. R. Huffman, and L. D. Lamb, “High resolution images of single C60 molecules on gold (111) using scanning tunneling microscopy,” Surf. Sci. 274, 141 (1992).
L. D. Lamb, D. R. Huffman, R. K. Workman, S. Howells, T. Chen, D. Sarid, and R. F. Ziolo, “Extraction and STM imaging of spherical giant fullerenes,” Science 255, 1413 (1992).
T. Chen, S. Howells, M. Gallagher, D. Sarid, L. D. Lamb, D. R. Huffman, and R. K. Workman, “Scanning tunneling microscopy and spectroscopy studies of C70 thin films on gold substrate,” Phys. Rev. B Rapid Comm. 45, 14411 (1992).
T. Chen and D. Sarid, “From bucky-balls and rugby-balls to giant fullerene molecules: A scanning tunneling microscopy and spectroscopy study,” Mod. Phys. Lett. B 6, 967 (Invited review, 1992).
T. Chen and D. Sarid, “C60 adsorption on the layered compound semiconductor MoS2 studied by scanning tunneling microscopy,” J. Vac. Sci. Technol. B 12, 1947 (1994).
D. Chen and D. Sarid, “Temperature effects of adsorption of C60 molecules on Si(111)-7x7 surfaces,” Phys. Rev. B 49, 7612 (1994).
D. Chen, M. J. Gallagher, and D. Sarid, “Scanning tunneling microscopy study of the adsorption of C60 molecules on Si(100)-2x1 surfaces,” J. Vac. Sci. Technol. B 12, 1947 (1994).
D. Chen, J. Chen, and D. Sarid, “Single monolayer ordered phases of C60 molecules on Si(111)-(7x7) surfaces,” Phys. Rev. B 50, 10905 (1994).
D. Chen and D. Sarid, “Growth of C60 films on silicon surfaces,” Surf. Sci. 318, 74 (1994).
D. Chen, J. Chen, and D. Sarid, “Si-C60-Si(111)-(7x7) interactions probed by scanning tunneling microscopy,” Surf. Sci. 321, 190 (1995).
D. Chen and D. Sarid, “An STM study of C60 adsorption on Si(100)-(2x1) surfaces: from physisorption to chemisorption,” Surf. Sci. 329, 206 (1995).
D. Chen, R. K. Workman, and D. Sarid, “Adsorption and decomposition of C60 molecules on Si(111) surfaces,” J. Vac. Sci. Technol. B 14, 1 (1996).
X. Yao, D. Chen, T. G. Ruskell, R. K. Workman, and D. Sarid, “Thermally-induced changes in bonding properties of C60 on Si(100)-(2x1) surfaces,” Israeli J. Chem. 36, 55 (1996).
X. Yao, T. G. Ruskell, R. K. Workman, D. Sarid, and D. Chen, “Scanning tunneling microscopy and spectroscopy of individual C60 on Si(100)-(2x1) surfaces,” Surf. Sci. Lett. 366, 743 (1996).
X. Yao, T. G. Ruskell, R. K. Workman, D. Sarid, and D. Chen, “Intramolecular features of individual C60 molecules on Si(100)-(2x1) surfaces observed by scanning tunneling microscopy,” Surf. Sci. Lett. 36, 786 (1996).
X. Yao, R. K. Workman, C. A. Peterson, D. Chen, and D. Sarid, “The bonding nature of individual C60 molecules to Si(100) surfaces,” Appl. Phys. A 66, s107 (1998).
M. Gallagher, D. Chen, B. P. Jacobsen, D. Sarid, L. D. Lamb, F. Tinker, J. Jiao, R. Huffman, S. Seraphin, and D. Zhou, “Study of carbon nanotubes by scanning tunneling microscopy, atomic force microscopy and high resolution transmission electron microscopy,” Surf. Sci. Lett. 281, L336 (1993).
R. Höper, R. K. Workman, D. Chen, D. Sarid, T. Yadav, J. C. Withers, and R. O. Loutfy, “Single-shell carbon nanotubes imaged by atomic force microscopy,” Surf. Sci. Lett. 311, L731 (1994).
D. Chen, R. K. Workman, and D. Sarid, “Fabrication of SiC films on Si(100) using a C60 molecular source,” Electr. Lett. 30, 1007 (1994).
D. Chen, R. K. Workman, and D. Sarid, “Growth mechanism of silicon carbide films on silicon substrates using C60 carbonization,” Surf. Sci. 344, 23 (1996).
D. Sarid and D. Chen, “Interaction of C60 molecules with silicon surfaces and the formation of SiC films,” J. Vac. Sci. Technol. 14, 979 (1996).
8.1 Laser Diode Interferometry
D. Sarid, D. Iams, V. Weissenberger, and L. S. Bell, “Compact scanning force microscope using a diode laser,” Opt. Lett. 28, 335 (1988).
D. Sarid, V. Weissenberger, D. A. Iams, and J. T. Ingle, “Theory of the laser diode interaction in a scanning force microscope,” IEEE J. Quantum Electron. 25, 1968 (1989).
D. Sarid, D. Iams, J. Ingle, V. Weissenberger, and J. Ploetz, “Performance of a scanning force microscope using a laser diode,” J. Vac. Sci. Technol. 8, 378 (1989).
D. Sarid, P. Pax, D. Bocek, and V. Elings, “Laser diode delivers atomically-resolved images,” Optics and Photonics News 3, 35 (1992).
D. Sarid, P. Pax, L. Yi, S. Howells, M. Gallagher, T. Chen, V. Elings, and D. Bocek, “Improved atomic force microscope using a laser diode interferometer,” Rev. Sci. Instrum. 63, 3905 (1992).
D. Sarid, D. Iams, V. Weissenberger, and L. S. Bell, “Compact scanning force microscope using a laser diode,” Selected Papers on Scanning Probe Microscopes Design and Applications, SPIE Milestone Series MS107, 210 (1996).
D. Sarid, “Laser Diode Detection,” section in Procedures in Scanning Probe Microscopy, John Wiley and Sons (1996).
D. Sarid and V. Elings, “Review of scanning force microscopy,” J. Vac. Sci. Technol. B 9 (2), 431 (1991).
S. Howells, M. Gallagher, L. Yi, T. Chen, and D. Sarid, “Enhanced effects with scanning force microscopy,” J. Appl. Phys. 69, 7330 (1991).
L. Yi, D. Sarid, S. Howells, M. Gallagher, and T. Chen, “Combined STM-AFM for magnetic applications,” AIP Conf. Proc., Scanned Probe Microscopies 241, 537 (1992).
J. Chen, R. K. Workman, D. Sarid, and R. Hoeper, “Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever,” Nanotechnol. 5, 199 (1994).
D. Sarid, J. Chen, and R. K. Workman, “Numerical simulations of a tapping mode scanning force microscope operating in a liquid,” Comp. Mat. Sci. 3, 475 (1995).
D. Sarid, “Tapping-mode scanning force microscopy: metallic tips and samples,” Comp. Mat. Sci. 5, 291 (1996).
D. Sarid, T. G. Ruskell, R. K. Workman, and D. Chen, “Driven nonlinear AFM cantilevers: from noncontact to tapping modes of operation,” J. Vac. Sci. Technol. 14, 864 (1996).
D. Sarid, J. P. Hunt, R. K. Workman, X. Yao, and C. A. Peterson, “The role of adhesion in tapping-mode atomic force microscopy,” Appl. Phys. A 66, s283 (1998).
J. P. Hunt and D. Sarid, “Kinetics of lossy grazing impact oscillators,” Appl. Phys. Lett. 72, 2969 (1998).
D. Sarid, C. A. Peterson, and X. Hu, “Dissipation vs. phase in nearly harmonic grazing impact oscillator,” Proc. of the 10th International Conference on STM/STS and Related Proximal Probe Microscopy” Seoul, Korea, 19-23 July, (1999).
A. Fein, Y. Zhao, C. A. Peterson, G. E. Jabbour, and D. Sarid, “Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy,” Appl. Phys. Lett. 79, 3935 (2001). This paper has been cited by Science Magazine as Editor’s Choice for Applied Physics, January 4th, page 15, 2002.
Y. Zhao, A. Fein, C. A. Peterson, and D. Sarid, “Comments on “Reversible, nanometer-scale transitions in an organic complex,” Phys. Rev. Lett. 87, 1797 (2001).
A. Fein, Y. Zhao, C. A. Peterson, G. E. Jabbour, and D. Sarid, “Individually injected current pulses with conducting-tip, tapping-mode atomic force microscopy,” Appl. Phys. Lett. 79, 3935 (2001). This paper has been cited by Science Magazine as Editor’s Choice for Applied Physics, January 4th, page 15, 2002.
B. Mc Carthy, Y. Zhao, R. Grover and D. Sarid, "Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip, "Appl. Phys. Lett. 86, 111914 (2005).
M. Lauters, B. Mc Carthy, D. Sarid and G. E. Jabbour, "Nonvolatile multilevel conductance and memory effects in organic thin films," Appl. Phys. Lett. 87, 231105 (2005).
T. G. Ruskell, R. K. Workman, D. Chen, S. Gilbert, S. Dahl and D. Sarid, “High resolution Fowler-Nordheim field emission maps of thin silicon oxide layers,” Appl. Phys. Lett. 68, 93 (1996).
C. A. Peterson, T. G. Ruskell, J. L. Pyle, R. K. Workman, X. Yao, J. P. Hunt, and D. Sarid, “Multi-step process control and characterization of scanning probe lithography,” Appl. Phys. A 66, s729 (1998).
C. A. Peterson, R. K. Workman, X. Yao, J. P. Hunt, and D. Sarid, “V-Shaped Metallic-Wire Cantilevers for Combined Atomic Force Microscopy and Fowler-Nordheim Imaging,” Nanotechnol. 9, 331 (1999).
C. A. Peterson, R. K. Workman, D. Sarid, B. Vermeire, H. G. Parks, D. Adderton, and P. Maivald, “Effects of moisture on Fowler-Nordheim characterization of thin silicon-oxide films,” J. Vac. Sci. Technol. 8, 2753 (1999).
C. A. Peterson, X. Hu and D. Sarid, “Comparative study of doped, oxidized silicon by AFM, STM, and TAFM,” Proc. of the 10th International Conference on STM/STS and Related Proximal Probe Microscopy, Seoul, Korea, 19-23 July (1999).
B. Vermeire, C. A. Peterson, H. G. Parks and D. Sarid, "Threshold voltage shift caused by copper contamination", IEEE International Reliability Physics Symposium Proceedings, pp. 315-318 (1999).
B. Vermeire, C. A. Peterson, H. G. Parks and D. Sarid, "The effect of copper contamination from HF and APM on the integrity of 3 nm gate oxides," Proceedings of the Sixth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, R. E. Novak, J. Ruzyllo and T. Hattori, eds. The Electrochemical Society, pp. 69-76 (2000).
C. A. Peterson, B. Vermeire, D. Sarid and H. G. Parks, “The reduction of surface roughening due to copper contamination prior to ultra-thin gate oxide,” App. Surf. Sci. 181, 28 (2001).
G. M. Laws, T. J. Thornton, Jinman Yang, L de la Garza, M. Kozicki, D. Gust, J. Gu and D. Sarid, “Drain control in a hybrid molecular/MOSFET device,” Physica E 17, 659 (2003).
R. Grover, B. Mc Carthy, Y. Zhao, G. E. Jabbour, D. Sarid, G. M. Laws, B. R. Takulapalli, and T. J. Thornton, "Kelvin force probe microscopy as a tool for characterizing chemical sensors," Appl. Phys. Lett. 85, 3926 (2004).
D. Sarid, B. Mc Carthy and R. Grover, "Scanning thermal-conductivity microscope," Rev. Sci. Instr. 77, 023703 (2006).
R. Grover, B. Mc Carthy and D. Sarid, "Mapping thermal conductivity using bimetallic atomic force microscopy probes," Appl. Phys. Lett. 88, 233501 (2006).
T. G. Ruskell, J. L. Pyle, R. K. Workman, X. Yao, and D. Sarid, “Current-dependent silicon oxide growth during scanned probe lithography,” Electron. Lett. 32, 1411 (1996).
J. L. Pyle, T. G. Ruskell, R. K. Workman, X. Yao, and D. Sarid, “Silicon nitride growth during scanned probe lithography,” J. Vac. Sci. Technol. B 15, 38 (1997).
T. X. Zhong, R. K. Workman, X.Yao, G. E. Jabbour, C. A. Peterson, D. Sarid, C. W. Dirk, D. de la Cruz, and A. Nagarur, “Stability and superstructure of squarylium dye TSQ Langmuir-Blodgett films,” Thin Solid Films 315, 294 (1998).
R. K. Workman, C. A. Peterson, and D. Sarid, “Current-dependent growth of silicon nitride using conducting tip AFM,” Surf. Sci. 423, L277 (1999).
X. Hu, D. Sarid and P. von Blanckenhagen, “Nano-patterning and single electron tunneling using STM,” Nanotechnol. 10, 209 (1999).
Y. Zhao, A. Fein, C. A. Peterson, and D. Sarid, “Comments on “Reversible, nanometer-scale transitions in an organic complex,” Phys. Rev. Lett. 87, 1797 (2001).
D. Sarid, C. A. Peterson, A. Fein, and Y. Zhao, “Exploring fractional calculus and fractional spaces with Mathematica,” 10th Interantional Mathematica Conference, Japan, June (2001).
D. Sarid and B. E. Springett, “Compact Corona Charging Device,” November 8, 1977, United States Patent 4,057,723.
D. Sarid and T. G. Davis, “Corona Device,” August 29, 1978, United States Patent 4,110,614.
B. E. Springett and D. Sarid, “Rotatable Corona Device,” November 1, 1977, United States Patent 4,056,723.
R. A. Sprague and D. Sarid, “Light Modulator/Deflector Using Acoustic Surface Waves,” August 31, 1982, United States Patent 4,346,965.
V. B. Elings, J. A. Gurley, and D. Sarid, “A Compact Scanning Force Microscope,” 1991, United States Patent 5,025,658.
V. B. Elings, J. A. Gurley, and D. Sarid, “Improved Compact Scanning Force Microscope,” 1993, United States Patent 5,189,906.
V. B. Elings, D. M. Adderton, and D. Sarid, “Atomic Force Microscope for Measuring Properties of Dielectric and Insulating Layers,” 1999, United States Patent 5,874,734.